[(Defects in SiO2 and Related Dielectrics: Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000 : Science and Technology)] [Edited by G. Pacchioni ] published on (December, 2000)

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Features

• [

• Defects in sio2 and related dielectrics: proceedings of the nato advanced study institute

• Erice

• Italy

• April 8-20

• 2000 : science and technology]

• Edited by g

• Pacchioni published on

• December

• 2000

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